Statistics of rare events in single-electron devices

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dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en
dc.contributor.advisor Golubev, Dmitri S., Dr., Aalto University, Department of Applied Physics, Finland
dc.contributor.advisor Peltonen, Joonas P., Dr., Aalto University, Department of Applied Physics, Finland
dc.contributor.author Singh, Shilpi
dc.date.accessioned 2019-02-12T10:01:05Z
dc.date.available 2019-02-12T10:01:05Z
dc.date.issued 2019
dc.identifier.isbn 978-952-60-8420-6 (electronic)
dc.identifier.isbn 978-952-60-8419-0 (printed)
dc.identifier.issn 1799-4942 (electronic)
dc.identifier.issn 1799-4934 (printed)
dc.identifier.issn 1799-4934 (ISSN-L)
dc.identifier.uri https://aaltodoc.aalto.fi/handle/123456789/36445
dc.description.abstract Developments in fabrication and control of nanoscale devices have made precise single-electron counting possible. Due to the improved stability of these devices, increasing amounts of data can be collected leading to unprecedented statistics. These features have enabled the experimental verification of various statistical physics concepts, such as fluctuation relations and Maxwell's demon, with high precision. The recent theory results on extreme fluctuations in the entropy produced by a system, and first passage times, have not yet been verified experimentally. The experimental studies of these theoretical concepts using single-electron devices are the focus of this thesis. The thesis starts with a brief introduction to the physics of single-electronic devices used in the experiments along with the experimental setup used to study them. Next, the experimental methods used to fabricate the samples and the basic sample characterization techniques are presented. Later, the theoretical concepts are discussed and compared to the experimental results. This part starts with the probability distribution of the filtered telegraph signal from a bistable system, here a single-electron transistor. The filtering is done in two different ways: low pass filtering and finite time-averaging of the signal. The former allows us to propose a new method to obtain the transition rates between two states of the bistable system using the cumulants of its distribution. The latter allows us to see the rare fluctuations of current and observe theoretically predicted elliptic tail of the logarithm of the averaged current distribution. Next, the stochastic entropy produced by a system is discussed. This part also includes the properties of its distribution and its minimum value. The theory is presented along with the experimental observations. Finally, an introduction to the theory of first-passage-time distributions is provided. en
dc.format.extent 97 + app. 55
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher Aalto University en
dc.publisher Aalto-yliopisto fi
dc.relation.ispartofseries Aalto University publication series DOCTORAL DISSERTATIONS en
dc.relation.ispartofseries 28/2019
dc.relation.haspart [Publication 1]: S. Singh, E. Mannila, D.S. Golubev, J.T. Peltonen, J.P. Pekola. Determining the parameters of a random telegraph signal by digital low pass filtering. Applied Physics Letters, Volume 112, 243101, June 2018. Full Text in Acris/Aaltodoc: http://urn.fi/URN:NBN:fi:aalto-201808014110. DOI: 10.1063/1.5033560
dc.relation.haspart [Publication 2]: S. Singh, J.T. Peltonen, I.M. Khaymovich, J.V. Koski, C. Flindt, J.P. Pekola. Distribution of current fluctuations in a bistable conductor. Physical Review B, Volume 94, Issue 24, 241407, December 2016. Full Text in Acris/Aaltodoc: http://urn.fi/URN:NBN:fi:aalto-201703233115. DOI: 10.1103/PhysRevB.94.241407
dc.relation.haspart [Publication 3]: S. Singh, É. Roldán, I. Neri, I. Khaymovich, D.S. Golubev, V.F. Maisi, J.T. Peltonen, F. Jülicher, J.P. Pekola. Extreme reductions of entropy in an electronic double dot. arXiv:1712.01693, Submitted 2018.
dc.relation.haspart [Publication 4]: S. Singh, P. Menczel, D.S. Golubev, I.M. Khaymovich, J.T. Peltonen, C. Flindt, K. Saito, É. Roldán, and J.P. Pekola. Universal First-Passage-Time Distribution of Non-Gaussian Currents. arXiv:1809.06870, Submitted 2018.
dc.subject.other Physics en
dc.title Statistics of rare events in single-electron devices en
dc.type G5 Artikkeliväitöskirja fi
dc.contributor.school Perustieteiden korkeakoulu fi
dc.contributor.school School of Science en
dc.contributor.department Teknillisen fysiikan laitos fi
dc.contributor.department Department of Applied Physics en
dc.subject.keyword tunnel junction en
dc.subject.keyword single-electron devices en
dc.subject.keyword bistable system en
dc.subject.keyword stochastic thermodynamics en
dc.subject.keyword entropy en
dc.subject.keyword first passage times en
dc.subject.keyword fluctuation relations en
dc.subject.keyword large deviations en
dc.identifier.urn URN:ISBN:978-952-60-8420-6
dc.type.dcmitype text en
dc.type.ontasot Doctoral dissertation (article-based) en
dc.type.ontasot Väitöskirja (artikkeli) fi
dc.contributor.supervisor Pekola, Jukka P., Prof., Aalto University, Department of Applied Physics, Finland
dc.opn Ciliberto, Sergio, Prof., Laboratoire de Physique de ENSL, France
dc.contributor.lab PICO-group en
dc.rev Ihn, Thomas, Prof., ETH Zurich, Switzerland
dc.rev Funo, Ken, Dr., RIKEN, Japan
dc.date.defence 2019-02-20
local.aalto.acrisexportstatus checked 2019-04-25_1013
local.aalto.infra OtaNano - Aalto Nanofab / Micronova en
local.aalto.infra Science-IT en
local.aalto.infra OtaNano - Low Temperature Laboratory en


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