Dynamic element matching in digital-to-analog converters with code-dependent output resistance

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dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en
dc.contributor.author Siddique, Muhammad
dc.contributor.author Roverato, Enrico
dc.contributor.author Kosunen, Marko
dc.contributor.author Ryynänen, Jussi
dc.date.accessioned 2018-12-10T10:25:50Z
dc.date.available 2018-12-10T10:25:50Z
dc.date.issued 2017-11-02
dc.identifier.citation Siddique , M , Roverato , E , Kosunen , M & Ryynänen , J 2017 , Dynamic element matching in digital-to-analog converters with code-dependent output resistance . in 2017 European Conference on Circuit Theory and Design (ECCTD) . , 8093326 , IEEE , European Conference on Circuit Theory and Design , Catania , Italy , 04/09/2017 . DOI: 10.1109/ECCTD.2017.8093326 en
dc.identifier.isbn 978-1-5386-3975-7
dc.identifier.isbn 978-1-5386-3974-0
dc.identifier.other PURE UUID: a6579df0-c228-4771-b9d8-d526ace7a75e
dc.identifier.other PURE ITEMURL: https://research.aalto.fi/en/publications/dynamic-element-matching-in-digitaltoanalog-converters-with-codedependent-output-resistance(a6579df0-c228-4771-b9d8-d526ace7a75e).html
dc.identifier.other PURE FILEURL: https://research.aalto.fi/files/27888454/ECCTD_2017_paper.pdf
dc.identifier.uri https://aaltodoc.aalto.fi/handle/123456789/35192
dc.description.abstract This paper evaluates the pertormance ot dynamic element matching (DEM) in digital-to-analog-converters, when the unit conversion cells of the converter have finite output resistance. DEM is already known to be effective against the static amplitude, timing and pulse shaped mismatches. However, the effect of output resistance and its mismatches has not been studied. A comprehensive code-dependent output resistance model for the current-steering DAC is presented. System level simulations show that the non-linearity caused by the output resistance, in the absence of mismatches, is not shaped by the DEM encoder since the output resistance is same for all the conversion cells. In this paper we demonstrate that, in the presence of mismatches, the DEM encoder is able to shape the non-linearity they cause since the output resistance now varies among different conversion cells. en
dc.format.extent 4
dc.format.mimetype application/pdf
dc.language.iso en en
dc.relation.ispartof European Conference on Circuit Theory and Design en
dc.relation.ispartofseries 2017 European Conference on Circuit Theory and Design (ECCTD) en
dc.rights openAccess en
dc.subject.other 213 Electronic, automation and communications engineering, electronics en
dc.title Dynamic element matching in digital-to-analog converters with code-dependent output resistance en
dc.type A4 Artikkeli konferenssijulkaisussa fi
dc.description.version Peer reviewed en
dc.contributor.department Department of Electronics and Nanoengineering
dc.subject.keyword 213 Electronic, automation and communications engineering, electronics
dc.identifier.urn URN:NBN:fi:aalto-201812106207
dc.identifier.doi 10.1109/ECCTD.2017.8093326
dc.type.version acceptedVersion


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