Title: | Solubility and Diffusivity |
Author(s): | Jensen, Mallory A. ; Morishige, Ashley E. ; Chakraborty, Sagnik ; Sharma, Romika ; Laine, Hannu S. ; Lai, Barry ; Rose, Volker ; Youssef, Amanda ; Looney, Erin E. ; Wieghold, Sarah ; Poindexter, Jeremy R. ; Correa-Baena, Juan Pablo ; Felisca, Tahina ; Savin, Hele ; Li, Joel B. ; Buonassisi, Tonio |
Date: | 2018-03-01 |
Language: | en |
Pages: | 8 448-455 |
Department: | Massachusetts Institute of Technology Solar Energy Research Institute of Singapore Department of Electronics and Nanoengineering Argonne National Laboratory |
Series: | IEEE Journal of Photovoltaics, Volume 8, issue 2 |
ISSN: | 2156-3381 2156-3403 |
DOI-number: | 10.1109/JPHOTOV.2018.2791411 |
Subject: | Electronic, Optical and Magnetic Materials, Condensed Matter Physics, Electrical and Electronic Engineering, 216 Materials engineering |
Keywords: | Carrier-induced degradation (CID), light-and elevated temperature-induced degradation (LeTID), light-induced degradation, materials reliability, multicrystalline silicon (mc-Si), passivated emitter and rear cell (PERC), silicon, synchrotron, X-ray fluorescence, Electronic, Optical and Magnetic Materials, Condensed Matter Physics, Electrical and Electronic Engineering, 216 Materials engineering |
|
|
This publication is imported from Aalto University Research information portal: https://research.aalto.fi
> View this publication in Research information portal > Other link related to publication (Research information portal) |
|
Jensen , M A , Morishige , A E , Chakraborty , S , Sharma , R , Laine , H S , Lai , B , Rose , V , Youssef , A , Looney , E E , Wieghold , S , Poindexter , J R , Correa-Baena , J P , Felisca , T , Savin , H , Li , J B & Buonassisi , T 2018 , ' Solubility and Diffusivity : Important Metrics in the Search for the Root Cause of Light-and Elevated Temperature-Induced Degradation ' IEEE Journal of Photovoltaics , vol 8 , no. 2 , pp. 448-455 . DOI: 10.1109/JPHOTOV.2018.2791411 |
|
Abstract:Light-and elevated temperature-induced degradation (LeTID) is a detrimental effect observed under operating conditions in p-Type multicrystalline silicon (mc-Si) solar cells. In this contribution, we employ synchrotron-based techniques to study the dissolution of precipitates due to different firing processes at grain boundaries in LeTID-Affected mc-Si. The synchrotron measurements show clear dissolution of collocated metal precipitates during firing. We compare our observations with degradation behavior in the same wafers. The experimental results are complemented with process simulations to provide insight into the change in bulk point defect concentration due to firing. Several studies have proposed that LeTID is caused by metal-rich precipitate dissolution during contact firing, and we find that the solubility and diffusivity are promising screening metrics to identify metals that are compatible with this hypothesis. While slower and less soluble elements (e.g., Fe and Cr) are not compatible according to our simulations, the point defect concentrations of faster and more soluble elements (e.g., Cu and Ni) increase after a high-Temperature firing process, primarily due to emitter segregation rather than precipitate dissolution. These results are a useful complement to lifetime spectroscopy techniques, and can be used to evaluate additional candidates in the search for the root cause of LeTID.
|
|
Rights:restrictedAccess |
|
Description:| openaire: EC/FP7/307315/EU//SOLARX
|
|
|
Files | Size | Format | View |
---|---|---|---|
There are no files associated with this item. |
Page content by: Aalto University Learning Centre | Privacy policy of the service | About this site