Citation:
Bautista , G , Kakko , J P , Dhaka , V , Zang , X , Karvonen , L , Jiang , H , Kauppinen , E , Lipsanen , H & Kauranen , M 2017 , ' Nonlinear microscopy using cylindrical vector beams : Applications to three-dimensional imaging of nanostructures ' , Optics Express , vol. 25 , no. 11 , pp. 12463-12468 . https://doi.org/10.1364/OE.25.012463
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Abstract:
The three-dimensional (3D) optical fields that arise from the focusing of cylindrical vector beams (CVB) with radial and azimuthal polarizations provide new sources of contrast for optical microscopy of nano-objects. So far, these demonstrations have been restricted to two-dimensional transversal scanning, i.e., along the focal plane of interest, or use of point-like objects, i.e., single molecules and nanoparticles. Here, we demonstrate the first application of CVBs for 3D imaging of 3D nano-objects. This technique is done by acquiring 3D image scans of the second-harmonic generation signal from vertically-aligned semiconductor nanowires, whose second-order response is primarily driven by the longitudinal electric field, i.e., the field component along the nanowire axis. Our technique provides a new way to study individual nano-objects in three dimensions through the unique combination of nonlinear microscopy and CVBs.
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