Coarsening dynamics of topological defects in thin permalloy films

 |  Login

Show simple item record

dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en
dc.contributor.author Rissanen, Ilari
dc.contributor.author Laurson, Lasse
dc.date.accessioned 2018-08-01T12:40:14Z
dc.date.available 2018-08-01T12:40:14Z
dc.date.issued 2016-10-21
dc.identifier.citation Rissanen , I & Laurson , L 2016 , ' Coarsening dynamics of topological defects in thin permalloy films ' PHYSICAL REVIEW B , vol 94 , no. 14 , 144428 , pp. 1-10 . DOI: 10.1103/PhysRevB.94.144428 en
dc.identifier.issn 1098-0121
dc.identifier.issn 1550-235X
dc.identifier.other PURE UUID: 34a92fef-5224-40b0-94f1-acf482e2fd94
dc.identifier.other PURE ITEMURL: https://research.aalto.fi/en/publications/coarsening-dynamics-of-topological-defects-in-thin-permalloy-films(34a92fef-5224-40b0-94f1-acf482e2fd94).html
dc.identifier.other PURE LINK: http://www.scopus.com/inward/record.url?scp=84994297232&partnerID=8YFLogxK
dc.identifier.other PURE FILEURL: https://research.aalto.fi/files/26776187/PhysRevB.94.144428.pdf
dc.identifier.uri https://aaltodoc.aalto.fi/handle/123456789/32717
dc.description.abstract We study the dynamics of topological defects in the magnetic texture of rectangular permalloy thin-film elements during relaxation from random magnetization initial states. Our full micromagnetic simulations reveal complex defect dynamics during relaxation towards the stable Landau closure domain pattern, manifested as temporal power-law decay, with a system-size-dependent cutoff time, of various quantities. These include the energy density of the system and the number densities of the different kinds of topological defects present in the system. The related power-law exponents assume nontrivial values and are found to be different for the different defect types. The exponents are robust against a moderate increase in the Gilbert damping constant and introduction of quenched structural disorder. We discuss details of the processes allowed by conservation of the winding number of the defects, underlying their complex coarsening dynamics. en
dc.format.extent 1-10
dc.format.mimetype application/pdf
dc.language.iso en en
dc.relation.ispartofseries PHYSICAL REVIEW B en
dc.relation.ispartofseries Volume 94, issue 14 en
dc.rights openAccess en
dc.subject.other Electronic, Optical and Magnetic Materials en
dc.subject.other Condensed Matter Physics en
dc.subject.other 114 Physical sciences en
dc.title Coarsening dynamics of topological defects in thin permalloy films en
dc.type A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä fi
dc.description.version Peer reviewed en
dc.contributor.department Department of Applied Physics
dc.subject.keyword Electronic, Optical and Magnetic Materials
dc.subject.keyword Condensed Matter Physics
dc.subject.keyword 114 Physical sciences
dc.identifier.urn URN:NBN:fi:aalto-201808014117
dc.identifier.doi 10.1103/PhysRevB.94.144428
dc.type.version publishedVersion


Files in this item

Files Size Format View

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record

Search archive


Advanced Search

article-iconSubmit a publication

Browse

My Account