Single-Electronic Radio-Frequency Refrigerator

Kafanov, Sergey; Kemppinen, Antti; Yu, A.; Pashkin, M.; Meschke, Matthias; Tsai, J.S; Pekola, Jukka P.

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dc.contributor	Aalto-yliopisto	fi
dc.contributor	Aalto University	en
dc.contributor.author	Kafanov, Sergey
dc.contributor.author	Kemppinen, Antti
dc.contributor.author	Yu, A.
dc.contributor.author	Pashkin, M.
dc.contributor.author	Meschke, Matthias
dc.contributor.author	Tsai, J.S
dc.contributor.author	Pekola, Jukka P.
dc.date.accessioned	2018-05-22T14:48:46Z
dc.date.available	2018-05-22T14:48:46Z
dc.date.issued	2009-09-17
dc.identifier.citation	Kafanov , S , Kemppinen , A , Yu , A , Pashkin , M , Meschke , M , Tsai , J S & Pekola , J P 2009 , ' Single-Electronic Radio-Frequency Refrigerator ' , Physical Review Letters , vol. 103 , no. 12 , 120801 , pp. 1-4 . https://doi.org/10.1103/PhysRevLett.103.120801	en
dc.identifier.issn	0031-9007
dc.identifier.issn	1079-7114
dc.identifier.other	PURE UUID: ce6bee18-c553-44f0-861f-842a4401a321
dc.identifier.other	PURE ITEMURL: https://research.aalto.fi/en/publications/ce6bee18-c553-44f0-861f-842a4401a321
dc.identifier.other	PURE FILEURL: https://research.aalto.fi/files/13437665/PhysRevLett.103.120801.pdf
dc.identifier.uri	https://aaltodoc.aalto.fi/handle/123456789/31177
dc.description.abstract	We demonstrate experimentally that a hybrid single-electron transistor with superconducting leads and a normal-metal island can be refrigerated by an alternating voltage applied to the gate electrode. The simultaneous measurement of the dc current induced by the rf gate through the device at a small bias voltage serves as an in situ thermometer.	en
dc.format.extent	4
dc.format.extent	1-4
dc.format.mimetype	application/pdf
dc.language.iso	en	en
dc.relation.ispartofseries	PHYSICAL REVIEW LETTERS	en
dc.relation.ispartofseries	Volume 103, issue 12	en
dc.rights	openAccess	en
dc.title	Single-Electronic Radio-Frequency Refrigerator	en
dc.type	A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä	fi
dc.description.version	Peer reviewed	en
dc.contributor.department	Department of Applied Physics
dc.identifier.urn	URN:NBN:fi:aalto-201805222617
dc.identifier.doi	10.1103/PhysRevLett.103.120801
dc.type.version	publishedVersion