Interface pinning in spontaneous imbibition

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dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en Dube, M. Majaniemi, S. Rost, M. Alava, MJ Elder, KR Ala-Nissilä, Tapio 2018-05-22T14:33:44Z 2018-05-22T14:33:44Z 2001-11
dc.identifier.citation Dube , M , Majaniemi , S , Rost , M , Alava , M J , Elder , K R & Ala-Nissilä , T 2001 , ' Interface pinning in spontaneous imbibition ' PHYSICAL REVIEW E , vol 64 , no. 5 , 051605 , pp. 1-6 . DOI: 10.1103/PhysRevE.64.051605 en
dc.identifier.issn 1063-651X
dc.identifier.issn 1550-2376
dc.identifier.other PURE UUID: 3a1730c5-d6ba-49bd-b9d6-ee7816954934
dc.identifier.other PURE ITEMURL:
dc.identifier.other PURE FILEURL:
dc.description.abstract Evaporation and gravity induced pinning in spontaneous imbibition are examined within a phase field formalism. Evaporation is introduced via a nonconserving, term and gravity through a convective term that constrains the influx of liquid. Their effects are described by dimensionless coupling constants epsilon and g, respectively. From liquid conservation, the early time behavior of the average interface position follows H(t)similar tot(1/2) until a crossover time t*(g, epsilon). After that the pinning height H-p(g,epsilon) is approached exponentially in time, in accordance with mean field theory. The statistical roughness of the interface is described by an exponent chi similar or equal to 1.25 at all stages of the rise, but the dynamic length scale controlling roughness crosses over from xi (x)similar toH(1/2) to a time independent pinning length scale xi (p)(epsilon ,g). en
dc.format.extent 1-6
dc.format.mimetype application/pdf
dc.language.iso en en
dc.relation.ispartofseries PHYSICAL REVIEW E en
dc.relation.ispartofseries Volume 64, issue 5 en
dc.rights openAccess en
dc.title Interface pinning in spontaneous imbibition en
dc.type A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä fi
dc.description.version Peer reviewed en
dc.contributor.department Department of Applied Physics en
dc.subject.keyword POROUS-MEDIA
dc.subject.keyword DRIVEN INTERFACES
dc.subject.keyword CAPILLARY RISE
dc.subject.keyword CONTACT LINE
dc.subject.keyword CONSERVED DYNAMICS
dc.subject.keyword DISORDERED MEDIUM
dc.subject.keyword MODEL
dc.subject.keyword ROUGHNESS
dc.subject.keyword THRESHOLD
dc.subject.keyword FRONTS
dc.identifier.urn URN:NBN:fi:aalto-201805222297
dc.identifier.doi 10.1103/PhysRevE.64.051605
dc.type.version publishedVersion

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