Utilizing the near-field Scanner in RF Immunity EMC testing in medical devices

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dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en
dc.contributor.advisor Pasanen, Mikko
dc.contributor.author Honkala, Esko
dc.date.accessioned 2018-04-03T13:22:53Z
dc.date.available 2018-04-03T13:22:53Z
dc.date.issued 2018-03-26
dc.identifier.uri https://aaltodoc.aalto.fi/handle/123456789/30503
dc.format.extent 8+75
dc.language.iso en en
dc.title Utilizing the near-field Scanner in RF Immunity EMC testing in medical devices en
dc.title Lähikenttäskannerin hyödyntäminen RF-immuniteetin EMC-testauksessa lääketieteellisille laitteille fi
dc.type G2 Pro gradu, diplomityö fi
dc.contributor.school Sähkötekniikan korkeakoulu fi
dc.subject.keyword EMC en
dc.subject.keyword near field en
dc.subject.keyword far field en
dc.subject.keyword capacitive coupling en
dc.subject.keyword inductive coupling en
dc.identifier.urn URN:NBN:fi:aalto-201804031967
dc.programme.major Translational Engineering fi
dc.programme.mcode ELEC3023 fi
dc.type.ontasot Master's thesis en
dc.type.ontasot Diplomityö fi
dc.contributor.supervisor Sepponen, Raimo
dc.programme AEE - Master’s Programme in Automation and Electrical Engineering (TS2013) fi
dc.ethesisid Aalto 9807
dc.location P1 fi

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