Measurement of Nanowire Optical Modes Using Cross-Polarization Microscopy

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dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en
dc.contributor.author Kakko, Joona-Pekko
dc.contributor.author Matikainen, Antti
dc.contributor.author Anttu, Nicklas
dc.contributor.author Kujala, Sami
dc.contributor.author Mäntynen, Henrik
dc.contributor.author Khayrudinov, Vladislav
dc.contributor.author Autere, Anton
dc.contributor.author Sun, Zhipei
dc.contributor.author Lipsanen, Harri
dc.date.accessioned 2018-02-09T09:58:38Z
dc.date.available 2018-02-09T09:58:38Z
dc.date.issued 2017-12-19
dc.identifier.citation Kakko , J-P , Matikainen , A , Anttu , N , Kujala , S , Mäntynen , H , Khayrudinov , V , Autere , A , Sun , Z & Lipsanen , H 2017 , ' Measurement of Nanowire Optical Modes Using Cross-Polarization Microscopy ' Scientific Reports , vol 7 , 17790 . DOI: 10.1038/s41598-017-18193-1 en
dc.identifier.issn 2045-2322
dc.identifier.other PURE UUID: 5f7b1b16-d565-4ddb-8da0-f65bb36ba201
dc.identifier.other PURE ITEMURL: https://research.aalto.fi/en/publications/measurement-of-nanowire-optical-modes-using-crosspolarization-microscopy(5f7b1b16-d565-4ddb-8da0-f65bb36ba201).html
dc.identifier.other PURE FILEURL: https://research.aalto.fi/files/16525367/s41598_017_18193_1.pdf
dc.identifier.uri https://aaltodoc.aalto.fi/handle/123456789/29845
dc.description.abstract A method to detect optical modes from vertical InGaAs nanowires (NWs) using cross-polarization microscopy is presented. Light scattered from the optical modes in the NWs is detected by filtering out the polarized direct reflection with a crossed polarizer. A spectral peak and a valley were seen to red-shift with increasing NW diameter in the measured spectra. The peak was assigned to scattering from the TE01 optical mode and the valley was an indication of the HE11 mode, based on finite-element and scattering matrix method simulations. The cross-polarization method can be used to experimentally determine the spectral positions of the TE01 and HE11 optical modes. The modes are significantly more visible in comparison to conventional reflectance measurements. The method can be beneficial in the characterization of NW solar cells, light-emitting diodes and lasers where precise mode control is required. en
dc.format.extent 7
dc.format.mimetype application/pdf
dc.language.iso en en
dc.relation.ispartofseries Scientific Reports en
dc.relation.ispartofseries Volume 7 en
dc.rights openAccess en
dc.subject.other 221 Nanotechnology en
dc.subject.other 216 Materials engineering en
dc.title Measurement of Nanowire Optical Modes Using Cross-Polarization Microscopy en
dc.type A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä fi
dc.description.version Peer reviewed en
dc.contributor.department Department of Electronics and Nanoengineering
dc.subject.keyword 221 Nanotechnology
dc.subject.keyword 216 Materials engineering
dc.identifier.urn URN:NBN:fi:aalto-201802091341
dc.identifier.doi 10.1038/s41598-017-18193-1
dc.type.version publishedVersion


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