Probing optical anisotropy of nanometer-thin van der waals microcrystals by near-field imaging

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dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en
dc.contributor.author Hu, Debo
dc.contributor.author Yang, Xiaoxia
dc.contributor.author Li, Chi
dc.contributor.author Liu, Ruina
dc.contributor.author Yao, Ziheng
dc.contributor.author Hu, Hai
dc.contributor.author Corder, Stephanie N.Gilbert
dc.contributor.author Chen, Jianing
dc.contributor.author Sun, Zhipei
dc.contributor.author Liu, Mengkun
dc.contributor.author Dai, Qing
dc.date.accessioned 2018-02-09T09:53:17Z
dc.date.available 2018-02-09T09:53:17Z
dc.date.issued 2017-12-01
dc.identifier.citation Hu , D , Yang , X , Li , C , Liu , R , Yao , Z , Hu , H , Corder , S N G , Chen , J , Sun , Z , Liu , M & Dai , Q 2017 , ' Probing optical anisotropy of nanometer-thin van der waals microcrystals by near-field imaging ' Nature Communications , vol 8 , no. 1 , 1471 . DOI: 10.1038/s41467-017-01580-7 en
dc.identifier.issn 2041-1723
dc.identifier.other PURE UUID: 0ee542d0-e8c8-4f56-a014-5a2c683b93fd
dc.identifier.other PURE ITEMURL: https://research.aalto.fi/en/publications/probing-optical-anisotropy-of-nanometerthin-van-der-waals-microcrystals-by-nearfield-imaging(0ee542d0-e8c8-4f56-a014-5a2c683b93fd).html
dc.identifier.other PURE LINK: http://www.scopus.com/inward/record.url?scp=85034257856&partnerID=8YFLogxK
dc.identifier.other PURE FILEURL: https://research.aalto.fi/files/16401147/sun_naturecommunication_s41467_017_01580_7.pdf
dc.identifier.uri https://aaltodoc.aalto.fi/handle/123456789/29734
dc.description.abstract Most van der Waals crystals present highly anisotropic optical responses due to their strong in-plane covalent bonding and weak out-of-plane interactions. However, the determination of the polarization-dependent dielectric constants of van der Waals crystals remains a nontrivial task, since the size and dimension of the samples are often below or close to the diffraction limit of the probe light. In this work, we apply an optical nano-imaging technique to determine the anisotropic dielectric constants in representative van der Waals crystals. Through the study of both ordinary and extraordinary waveguide modes in real space, we are able to quantitatively determine the full dielectric tensors of nanometer-thin molybdenum disulfide and hexagonal boron nitride microcrystals, the most-promising van der Waals semiconductor and dielectric. Unlike traditional reflection-based methods, our measurements are reliable below the length scale of the free-space wavelength and reveal a universal route for characterizing low-dimensional crystals with high anisotropies. en
dc.format.mimetype application/pdf
dc.language.iso en en
dc.relation.ispartofseries Nature Communications en
dc.relation.ispartofseries Volume 8, issue 1 en
dc.rights openAccess en
dc.subject.other Chemistry(all) en
dc.subject.other Biochemistry, Genetics and Molecular Biology(all) en
dc.subject.other Physics and Astronomy(all) en
dc.subject.other 221 Nanotechnology en
dc.title Probing optical anisotropy of nanometer-thin van der waals microcrystals by near-field imaging en
dc.type A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä fi
dc.description.version Peer reviewed en
dc.contributor.department Chinese Academy of Sciences
dc.contributor.department Stony Brook University
dc.contributor.department CAS - Institute of Physics
dc.contributor.department Department of Electronics and Nanoengineering
dc.subject.keyword Chemistry(all)
dc.subject.keyword Biochemistry, Genetics and Molecular Biology(all)
dc.subject.keyword Physics and Astronomy(all)
dc.subject.keyword 221 Nanotechnology
dc.identifier.urn URN:NBN:fi:aalto-201802091230
dc.identifier.doi 10.1038/s41467-017-01580-7
dc.type.version publishedVersion


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