Indirect Off-Axis Holography for Antenna Metrology

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dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en
dc.contributor.author Arboleya, Ana
dc.contributor.author Laviada, Jaime
dc.contributor.author Ala-Laurinaho, Juha
dc.contributor.author Álvarez, Yuri
dc.contributor.author Las-Heras, Fernando
dc.contributor.author Räisänen, Antti V.
dc.contributor.editor Naydenova, Izabela
dc.contributor.editor Nazarova, Dimana
dc.contributor.editor Babeva, Tsvetanka
dc.date.accessioned 2017-10-15T20:41:50Z
dc.date.available 2017-10-15T20:41:50Z
dc.date.issued 2017
dc.identifier.citation Arboleya , A , Laviada , J , Ala-Laurinaho , J , Álvarez , Y , Las-Heras , F & Räisänen , A V 2017 , Indirect Off-Axis Holography for Antenna Metrology . in I Naydenova , D Nazarova & T Babeva (eds) , Holographic Materials and Optical Systems . InTech , Rijeka , pp. 243-269 . DOI: 10.5772/67294 en
dc.identifier.isbn 978-953-51-3037-6
dc.identifier.isbn 978-953-51-3038-3
dc.identifier.other PURE UUID: a9fb32c1-e387-47f5-ad3d-482ee21e4bc5
dc.identifier.other PURE ITEMURL: https://research.aalto.fi/en/publications/indirect-offaxis-holography-for-antenna-metrology(a9fb32c1-e387-47f5-ad3d-482ee21e4bc5).html
dc.identifier.other PURE FILEURL: https://research.aalto.fi/files/15328635/raisanen_et_al.pdf
dc.identifier.uri https://aaltodoc.aalto.fi/handle/123456789/28268
dc.description.abstract Phase acquisition in antenna measurement, especially at millimeter- and submillimeter-wave frequencies, is an expensive and challenging task. The need of a steady phase reference demands not only a very stable source but unvarying temperature conditions and strong positioning accuracy requirements. Indirect off-axis holography is an interferometric technique that allows for characterization of an unknown field by means of a simple filtering process of the hologram or intensity interference pattern in the spectral domain, provided that the reference field, employed to interfere with the unknown field, is known in amplitude and phase. This technique can be used to avoid the effect of the errors related to the phase acquisition and to further develop new efficient and robust techniques capable of phase retrieval from amplitude-only acquisitions allowing for cost and complexity reduction of the measurement setup. A short review of the state-of-the-art in antenna metrology is presented in this chapter, as well as a description of conventional indirect off-axis techniques applied to this field. Last sections are devoted to the description of novel measurement techniques developed by the authors in order to overcome the main limitations of the conventional methods. en
dc.format.extent 243-269
dc.format.mimetype application/pdf
dc.language.iso en en
dc.relation.ispartofseries Holographic Materials and Optical Systems en
dc.rights openAccess en
dc.subject.other 213 Electronic, automation and communications engineering, electronics en
dc.title Indirect Off-Axis Holography for Antenna Metrology en
dc.type A3 Kirjan tai muun kokoomateoksen osa fi
dc.description.version Peer reviewed en
dc.contributor.department University of Oviedo
dc.contributor.department Department of Radio Science and Engineering
dc.contributor.department Department of Electronics and Nanoengineering en
dc.subject.keyword antenna measurement
dc.subject.keyword antenna diagnostics
dc.subject.keyword amplitude-only
dc.subject.keyword interferometry
dc.subject.keyword off-axis holography
dc.subject.keyword indirect holography
dc.subject.keyword phaseless
dc.subject.keyword microwave holography
dc.subject.keyword millimeter-wave
dc.subject.keyword submillimeter-wave
dc.subject.keyword 213 Electronic, automation and communications engineering, electronics
dc.identifier.urn URN:NBN:fi:aalto-201710157128
dc.identifier.doi 10.5772/67294
dc.type.version publishedVersion


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