Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions

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dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en
dc.contributor.author Kawai, Shigeki
dc.contributor.author F. Canova, Filippo
dc.contributor.author Glatzel, Thilo
dc.contributor.author Hynninen, Teemu
dc.contributor.author Meyer, Ernst
dc.contributor.author Foster, Adam S.
dc.date.accessioned 2017-10-15T20:39:55Z
dc.date.available 2017-10-15T20:39:55Z
dc.date.issued 2012
dc.identifier.citation Kawai , S , F. Canova , F , Glatzel , T , Hynninen , T , Meyer , E & Foster , A S 2012 , ' Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions ' , Physical Review Letters , vol. 109 , no. 14 , 146101 , pp. 1-5 . https://doi.org/10.1103/PhysRevLett.109.146101 en
dc.identifier.issn 0031-9007
dc.identifier.issn 1079-7114
dc.identifier.other PURE UUID: 778753b3-0255-498b-ba8a-4f8bf10f5752
dc.identifier.other PURE ITEMURL: https://research.aalto.fi/en/publications/measuring-electric-field-induced-subpicometer-displacement-of-step-edge-ions(778753b3-0255-498b-ba8a-4f8bf10f5752).html
dc.identifier.other PURE FILEURL: https://research.aalto.fi/files/14764093/PhysRevLett.109.146101.pdf
dc.identifier.uri https://aaltodoc.aalto.fi/handle/123456789/28224
dc.description.abstract We provide unambiguous evidence that the applied electrostatic field displaces step atoms of ionic crystal surfaces by subpicometers in different directions via the measurement of the lateral force interactions by bimodal dynamic force microscopy combined with multiscale theoretical simulations. Such a small imbalance in the electrostatic interaction of the shifted anion-cation ions leads to an extraordinary long-range feature potential variation and is now detectable with the extreme sensitivity of the bimodal detection. en
dc.format.extent 5
dc.format.extent 1-5
dc.format.mimetype application/pdf
dc.language.iso en en
dc.relation.ispartofseries PHYSICAL REVIEW LETTERS en
dc.relation.ispartofseries Volume 109, issue 14 en
dc.rights openAccess en
dc.subject.other 114 Physical sciences en
dc.subject.other 221 Nanotechnology en
dc.subject.other 214 Mechanical engineering en
dc.subject.other 218 Environmental engineering en
dc.title Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions en
dc.type A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä fi
dc.description.version Peer reviewed en
dc.contributor.department Department of Applied Physics
dc.subject.keyword AFM, KPFM, NaCl
dc.subject.keyword AFM
dc.subject.keyword KPFM
dc.subject.keyword NaCl
dc.subject.keyword 114 Physical sciences
dc.subject.keyword 221 Nanotechnology
dc.subject.keyword 214 Mechanical engineering
dc.subject.keyword 218 Environmental engineering
dc.identifier.urn URN:NBN:fi:aalto-201710157084
dc.identifier.doi 10.1103/PhysRevLett.109.146101
dc.type.version publishedVersion


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