Lock-in thermography approach for imaging the efficiency of light emitters and optical coolers

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dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en
dc.contributor.author Radevici, Ivan
dc.contributor.author Tiira, Jonna
dc.contributor.author Oksanen, Jani
dc.date.accessioned 2017-05-25T09:01:49Z
dc.date.available 2017-05-25T09:01:49Z
dc.date.issued 2017
dc.identifier.citation Radevici, Ivan & Tiira, Jonna & Oksanen, Jani. 2017. Lock-in thermography approach for imaging the efficiency of light emitters and optical coolers. SPIE Proceedings. Volume 10121. 7. DOI: 10.1117/12.2249978. en
dc.identifier.uri https://aaltodoc.aalto.fi/handle/123456789/26280
dc.description.abstract Developing optical cooling technologies requires access to reliable efficiency measurement techniques and ability to detect spatial variations in the efficiency and light emission of the devices. We investigate the possibility to combine the calorimetric efficiency measurement principles with lock-in thermography (LIT) and conventional luminescence microscopy to enable spatially resolved measurement of the efficiency, current spreading and local device heating of double diode structures (DDS) serving as test vessels for developing thermophotonic cooling devices. Our approach enables spatially resolved characterization and localization of the losses of the double diode structures as well as other light emitting semiconductor devices. In particular, the approach may allow directly observing effects like current crowding and surface recombination on the light emission and heating of the DDS devices. fi
dc.format.extent 7
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher SPIE en
dc.relation info:eu-repo/grantAgreement/EC/H2020/638173/EU//iTPX fi
dc.relation.ispartofseries SPIE Proceedings fi
dc.relation.ispartofseries Volume 10121 fi
dc.rights © 2017 SPIE. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. en
dc.subject.other Electrical engineering en
dc.subject.other Physics en
dc.title Lock-in thermography approach for imaging the efficiency of light emitters and optical coolers en
dc.type A4 Artikkeli konferenssijulkaisussa fi
dc.description.version Peer reviewed en
dc.rights.holder SPIE
dc.contributor.school Perustieteiden korkeakoulu fi
dc.contributor.school School of Science en
dc.contributor.department Neurotieteen ja lääketieteellisen tekniikan laitos fi
dc.contributor.department Department of Neuroscience and Biomedical Engineering en
dc.subject.keyword lock-in thermography en
dc.subject.keyword calorimetry en
dc.subject.keyword efficiency en
dc.identifier.urn URN:NBN:fi:aalto-201705154740
dc.type.dcmitype text en
dc.identifier.doi 10.1117/12.2249978
dc.type.version Post print en

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