Parts:
Hyvönen N., 2002. Analysis of optical tomography with non-scattering regions. Proceedings of the Edinburgh Mathematical Society 45, number 2, pages 257-276.Hyvönen N., 2004. Complete electrode model of electrical impedance tomography: approximation properties and characterization of inclusions. SIAM Journal on Applied Mathematics 64, number 3, pages 902-931. [article2.pdf] © 2004 Society for Industrial and Applied Mathematics (SIAM). By permission.Hyvönen N., 2004. Characterizing inclusions in optical tomography. Inverse Problems 20, number 3, pages 737-751. [article3.pdf] © 2004 Institute of Physics Publishing Ltd. By permission.
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