Learning Centre

Andreev current for low temperature thermometry

 |  Login

Show simple item record

dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en
dc.contributor.author Faivre, T.
dc.contributor.author Golubev, Dmitry
dc.contributor.author Pekola, Jukka
dc.date.accessioned 2016-09-23T08:16:26Z
dc.date.issued 2015
dc.identifier.citation Faivre , T , Golubev , D & Pekola , J 2015 , ' Andreev current for low temperature thermometry ' , Applied Physics Letters , vol. 106 , no. 18 , 182602 , pp. 1-4 . https://doi.org/10.1063/1.4919892 en
dc.identifier.issn 0003-6951
dc.identifier.issn 1077-3118
dc.identifier.other PURE UUID: 7f6968d3-3508-4450-a285-444e6a06275c
dc.identifier.other PURE ITEMURL: https://research.aalto.fi/en/publications/7f6968d3-3508-4450-a285-444e6a06275c
dc.identifier.other PURE LINK: http://dx.doi.org/10.1063/1.4919892
dc.identifier.other PURE FILEURL: https://research.aalto.fi/files/4192081/1.4919892.pdf
dc.identifier.uri https://aaltodoc.aalto.fi/handle/123456789/22317
dc.description VK: Low Temperature Laboratory
dc.description.abstract We demonstrate experimentally that disorder enhanced Andreev current in a tunnel junction between a normal metal and a superconductor provides a method to measure electronic temperature, specifically at temperatures below 200 mK when aluminum is used. This Andreev thermometer has some advantages over conventional quasiparticle thermometers: For instance, it does not conduct heat and its reading does not saturate until at lower temperatures. Another merit is that the responsivity is constant over a wide temperature range. en
dc.format.extent 4
dc.format.extent 1-4
dc.format.mimetype application/pdf
dc.language.iso en en
dc.relation.ispartofseries Applied Physics Letters en
dc.relation.ispartofseries Volume 106, issue 18 en
dc.rights openAccess en
dc.title Andreev current for low temperature thermometry en
dc.type A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä fi
dc.description.version Peer reviewed en
dc.contributor.department Department of Applied Physics
dc.identifier.urn URN:NBN:fi:aalto-201609234321
dc.identifier.doi 10.1063/1.4919892
dc.type.version publishedVersion

Files in this item

Files Size Format View

There are no open access files associated with this item.

This item appears in the following Collection(s)

Show simple item record

Search archive

Advanced Search

article-iconSubmit a publication