Andreev current for low temperature thermometry

Faivre, T.; Golubev, Dmitry; Pekola, Jukka

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dc.contributor	Aalto-yliopisto	fi
dc.contributor	Aalto University	en
dc.contributor.author	Faivre, T.
dc.contributor.author	Golubev, Dmitry
dc.contributor.author	Pekola, Jukka
dc.date.accessioned	2016-09-23T08:16:26Z
dc.date.issued	2015
dc.identifier.citation	Faivre , T , Golubev , D & Pekola , J 2015 , ' Andreev current for low temperature thermometry ' , Applied Physics Letters , vol. 106 , no. 18 , 182602 , pp. 1-4 . https://doi.org/10.1063/1.4919892	en
dc.identifier.issn	0003-6951
dc.identifier.issn	1077-3118
dc.identifier.other	PURE UUID: 7f6968d3-3508-4450-a285-444e6a06275c
dc.identifier.other	PURE ITEMURL: https://research.aalto.fi/en/publications/7f6968d3-3508-4450-a285-444e6a06275c
dc.identifier.other	PURE LINK: http://dx.doi.org/10.1063/1.4919892
dc.identifier.other	PURE FILEURL: https://research.aalto.fi/files/4192081/1.4919892.pdf
dc.identifier.uri	https://aaltodoc.aalto.fi/handle/123456789/22317
dc.description	VK: Low Temperature Laboratory
dc.description.abstract	We demonstrate experimentally that disorder enhanced Andreev current in a tunnel junction between a normal metal and a superconductor provides a method to measure electronic temperature, specifically at temperatures below 200 mK when aluminum is used. This Andreev thermometer has some advantages over conventional quasiparticle thermometers: For instance, it does not conduct heat and its reading does not saturate until at lower temperatures. Another merit is that the responsivity is constant over a wide temperature range.	en
dc.format.extent	4
dc.format.extent	1-4
dc.format.mimetype	application/pdf
dc.language.iso	en	en
dc.relation.ispartofseries	Applied Physics Letters	en
dc.relation.ispartofseries	Volume 106, issue 18	en
dc.rights	openAccess	en
dc.title	Andreev current for low temperature thermometry	en
dc.type	A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä	fi
dc.description.version	Peer reviewed	en
dc.contributor.department	Department of Applied Physics
dc.identifier.urn	URN:NBN:fi:aalto-201609234321
dc.identifier.doi	10.1063/1.4919892
dc.type.version	publishedVersion