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Improving the Utilization of Statistical Failure Models in Component Level Testing

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dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en
dc.contributor.advisor Kärkäs, Reijo
dc.contributor.author Seppälä, Veera
dc.date.accessioned 2016-06-17T12:23:29Z
dc.date.available 2016-06-17T12:23:29Z
dc.date.issued 2016-06-13
dc.identifier.uri https://aaltodoc.aalto.fi/handle/123456789/20837
dc.format.extent 72+9
dc.language.iso en en
dc.title Improving the Utilization of Statistical Failure Models in Component Level Testing en
dc.title Tilastollisten vikamallien käytön kehittäminen komponenttien testauksessa fi
dc.type G2 Pro gradu, diplomityö fi
dc.contributor.school Sähkötekniikan korkeakoulu fi
dc.subject.keyword PAT en
dc.subject.keyword MEMS en
dc.subject.keyword statistical screening en
dc.subject.keyword testing en
dc.identifier.urn URN:NBN:fi:aalto-201606172445
dc.programme.major Elektroniikka ja sovellukset fi
dc.programme.mcode S3007 fi
dc.type.ontasot Master's thesis en
dc.type.ontasot Diplomityö fi
dc.contributor.supervisor Paulasto-Kröckel, Mervi
dc.programme EST - Elektroniikka ja sähkötekniikka (TS2005) fi
dc.location P1 fi
local.aalto.openaccess no
dc.rights.accesslevel closedAccess
local.aalto.idinssi 53877
dc.type.publication masterThesis
dc.type.okm G2 Pro gradu, diplomityö


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