Maskless, High-Precision, Persistent, and Extreme Wetting-Contrast Patterning in an Environmental Scanning Electron Microscope

Liimatainen, Ville; Shah, Ali; Johansson, Leena-Sisko; Houbenov, Nikolay; Zhou, Quan

Aaltodoc
→
6a Artikkelit / Articles
→
[article] Sähkötekniikan korkeakoulu / ELEC
→
View Item

Maskless, High-Precision, Persistent, and Extreme Wetting-Contrast Patterning in an Environmental Scanning Electron Microscope

Altmetrics



Title:	Maskless, High-Precision, Persistent, and Extreme Wetting-Contrast Patterning in an Environmental Scanning Electron Microscope
Author(s):	Liimatainen, Ville ; Shah, Ali ; Johansson, Leena-Sisko ; Houbenov, Nikolay ; Zhou, Quan
Date:	2016
Language:	en
Pages:	18
Department:	Sähkötekniikan ja automaation laitos Department of Electrical Engineering and Automation
Series:	Small
ISSN:	1613-6810 (printed)
DOI-number:	10.1002/smll.201503127
Subject:	Automation, Chemistry, Physics
Keywords:	electron beam modification, ESEM, superhydrophilicity, superhydrophobicity, wettability patterning
» Show full item record
Citation: Liimatainen, Ville & Shah, Ali & Johansson, Leena-Sisko & Houbenov, Nikolay & Zhou, Quan. 2016. Maskless, High-Precision, Persistent, and Extreme Wetting-Contrast Patterning in an Environmental Scanning Electron Microscope. Small. 18. 1613-6810 (printed). DOI: 10.1002/smll.201503127.
Rights: © 2016 Wiley-Blackwell. This is the pre pint version of the following article: Liimatainen, Ville & Shah, Ali & Johansson, Leena-Sisko & Houbenov, Nikolay & Zhou, Quan. 2016. Maskless, High-Precision, Persistent, and Extreme Wetting-Contrast Patterning in an Environmental Scanning Electron Microscope. Small. 18. ISSN 1613-6810 (printed). DOI: 10.1002/smll.201503127, which has been published in final form at http://onlinelibrary.wiley.com/doi/10.1002/smll.201503127/abstract.
Permanent link to this item: http://urn.fi/URN:NBN:fi:aalto-201602171414 Email this Export to RefWorks QR Code Print BibTex Tweet

Files in this item

Name: A1_liimatainen_ville_2016.pdf

Size: 1.473Mb

Format: PDF

View/Open

Unless otherwise stated, all rights belong to the author. You may download, display and print this publication for Your own personal use. Commercial use is prohibited.