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Shot noise and conductivity at high bias in bilayer graphene: Signatures of electron-optical phonon coupling

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dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en
dc.contributor.author Fay, A.
dc.contributor.author Danneau, R.
dc.contributor.author Viljas, J. K.
dc.contributor.author Wu, F.
dc.contributor.author Tomi, M. Y.
dc.contributor.author Wengler, J.
dc.contributor.author Wiesner, M.
dc.contributor.author Hakonen, Pertti J.
dc.date.accessioned 2015-09-04T10:15:12Z
dc.date.available 2015-09-04T10:15:12Z
dc.date.issued 2011
dc.identifier.citation Fay, A. & Danneau, R. & Viljas, J. K. & Wu, F. & Tomi, M. Y. & Wengler, J. & Wiesner, M. & Hakonen, Pertti J. 2011. Shot noise and conductivity at high bias in bilayer graphene: Signatures of electron-optical phonon coupling. Physical Review B. Volume 84, Issue 24. 245427/1-7. ISSN 1098-0121 (printed). DOI: 10.1103/physrevb.84.245427 en
dc.identifier.issn 1098-0121 (printed)
dc.identifier.uri https://aaltodoc.aalto.fi/handle/123456789/17615
dc.description.abstract We have studied electronic conductivity and shot noise of bilayer graphene (BLG) sheets at high bias voltages and low bath temperature T0=4.2 K. As a function of bias, we find initially an increase of the differential conductivity, which we attribute to self-heating. At higher bias, the conductivity saturates and even decreases due to backscattering from optical phonons. The electron-phonon interactions are also responsible for the decay of the Fano factor at bias voltages V>0.1 V. The high bias electronic temperature has been calculated from shot-noise measurements, and it goes up to ∼1200 K at V=0.75 V. Using the theoretical temperature dependence of BLG conductivity, we extract an effective electron-optical phonon scattering time τe–op. In a 230-nm-long BLG sample of mobility μ=3600 cm exp 2 exp V−1 s exp −1, we find that τe–op decreases with increasing voltage and is close to the charged impurity scattering time τimp=60 fs at V=0.6 V. en
dc.format.extent 245427/1-7
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher American Physical Society (APS) en
dc.relation.ispartofseries Physical Review B en
dc.relation.ispartofseries Volume 84, Issue 24
dc.rights © 2011 American Physical Society (APS). This is the accepted version of the following article: Fay, A. & Danneau, R. & Viljas, J. K. & Wu, F. & Tomi, M. Y. & Wengler, J. & Wiesner, M. & Hakonen, Pertti J. 2011. Shot noise and conductivity at high bias in bilayer graphene: Signatures of electron-optical phonon coupling. Physical Review B. Volume 84, Issue 24. 245427/1-7. ISSN 1098-0121 (printed). DOI: 10.1103/physrevb.84.245427, which has been published in final form at http://journals.aps.org/prb/abstract/10.1103/PhysRevB.84.245427. en
dc.subject.other Physics en
dc.title Shot noise and conductivity at high bias in bilayer graphene: Signatures of electron-optical phonon coupling en
dc.type A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä fi
dc.description.version Peer reviewed en
dc.rights.holder American Physical Society (APS)
dc.contributor.school Perustieteiden korkeakoulu fi
dc.contributor.school School of Science en
dc.contributor.department Teknillisen fysiikan laitos fi
dc.contributor.department Department of Applied Physics en
dc.subject.keyword field-effect transistors en
dc.subject.keyword quantum transport en
dc.subject.keyword carbon nanotubes en
dc.subject.keyword chaotic cavities en
dc.subject.keyword scattering en
dc.subject.keyword devices en
dc.subject.keyword states en
dc.subject.keyword suppression en
dc.identifier.urn URN:NBN:fi:aalto-201509034230
dc.type.dcmitype text en
dc.identifier.doi 10.1103/physrevb.84.245427
dc.type.version Final published version en


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