Rights:
© 1984 American Physical Society (APS). This is the accepted version of the following article: Manninen, M. & Puska, M. J. & Nieminen, Risto M. & Jena, P. 1984. Electronically induced trapping of hydrogen by impurities in niobium. Physical Review B. Volume 30, Issue 2. 1065-1068. ISSN 1550-235X (electronic). DOI: 10.1103/physrevb.30.1065, which has been published in final form at http://journals.aps.org/prb/abstract/10.1103/PhysRevB.30.1065.