Simulating atomic force microscopy imaging of the ideal and defected TiO2 (110) surface

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dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en
dc.contributor.author Foster, Adam S.
dc.contributor.author Pakarinen, O. H.
dc.contributor.author Airaksinen, J. M.
dc.contributor.author Gale, J. D.
dc.contributor.author Nieminen, Risto M.
dc.date.accessioned 2015-07-30T09:01:38Z
dc.date.available 2015-07-30T09:01:38Z
dc.date.issued 2003
dc.identifier.citation Foster, A. S. & Pakarinen, O. H. & Airaksinen, J. M. & Gale, J. D. & Nieminen, Risto M. 2003. Simulating atomic force microscopy imaging of the ideal and defected TiO2 (110) surface. Physical Review B. Volume 68, Issue 19. 195410-1-8. ISSN 1550-235X (electronic). DOI: 10.1103/physrevb.68.195410. en
dc.identifier.issn 1550-235X (electronic)
dc.identifier.uri https://aaltodoc.aalto.fi/handle/123456789/17312
dc.description.abstract In this study we simulate noncontact atomic force microscopy imaging of the TiO2 (110) surface using first-principles and atomistic methods. We use three different tip models to investigate the tip-surface interaction on the ideal surface, and find that agreement with experiment is found for either a silicon tip or a tip with a net positive electrostatic potential from the apex. Both predict bright contrast over the bridging oxygen rows. We then study the interaction of this tip with a bridging oxygen vacancy on the surface, and find that the much weaker interaction observed would result in vacancies appearing as dark contrast along the bright rows in images. en
dc.format.extent 195410-1-8
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher American Physical Society (APS) en
dc.relation.ispartofseries Physical Review B en
dc.relation.ispartofseries Volume 68, Issue 19
dc.rights © 2003 American Physical Society (APS). This is the accepted version of the following article: Foster, A. S. & Pakarinen, O. H. & Airaksinen, J. M. & Gale, J. D. & Nieminen, Risto M. 2003. Simulating atomic force microscopy imaging of the ideal and defected TiO2 (110) surface. Physical Review B. Volume 68, Issue 19. 195410-1-8. ISSN 1550-235X (electronic). DOI: 10.1103/physrevb.68.195410, which has been published in final form at http://journals.aps.org/prb/abstract/10.1103/PhysRevB.68.195410. en
dc.subject.other Physics en
dc.title Simulating atomic force microscopy imaging of the ideal and defected TiO2 (110) surface en
dc.type A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä fi
dc.description.version Peer reviewed en
dc.rights.holder American Physical Society (APS)
dc.contributor.school Perustieteiden korkeakoulu fi
dc.contributor.school School of Science en
dc.contributor.department Teknillisen fysiikan laitos fi
dc.contributor.department Department of Applied Physics en
dc.subject.keyword atomic force microscopy en
dc.subject.keyword tip-surface interactions en
dc.subject.keyword silicon en
dc.subject.keyword oxygen en
dc.identifier.urn URN:NBN:fi:aalto-201507303942
dc.type.dcmitype text en
dc.identifier.doi 10.1103/physrevb.68.195410
dc.type.version Final published version en


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