Citation:
Prunnila, M. & Meschke, M. & Gunnarsson, D. & Enouz-Vedrenne, S. & Kivioja, J. M. & Pekola, Jukka. 2010. Ex situ tunnel junction process technique characterized by Coulomb blockade thermometry. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. Volume 28, Issue 5. 1026-1029. ISSN 1071-1023 (printed). DOI: 10.1116/1.3490406.
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