Leakage current of a superconductor–normal metal tunnel junction connected to a high-temperature environment

 |  Login

Show simple item record

dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en
dc.contributor.author Di Marco, A.
dc.contributor.author Maisi, V. F.
dc.contributor.author Pekola, Jukka P.
dc.contributor.author Hekking, F. W. J.
dc.date.accessioned 2015-05-23T09:00:55Z
dc.date.available 2015-05-23T09:00:55Z
dc.date.issued 2013
dc.identifier.citation Di Marco, A. & Maisi, V. F. & Pekola, Jukka & Hekking, F. W. J. 2013. Leakage current of a superconductor–normal metal tunnel junction connected to a high-temperature environment. Physical Review B. Volume 88, Issue 17. P. 174507/1-9. ISSN 1098-0121 (printed). DOI: 10.1103/physrevb.88.174507. en
dc.identifier.issn 1098-0121 (printed)
dc.identifier.uri https://aaltodoc.aalto.fi/handle/123456789/16206
dc.description.abstract We consider a voltage-biased normal metal-insulator-superconductor (NIS) tunnel junction, connected to a high-temperature external electromagnetic environment. This model system features the commonly observed subgap leakage current in NIS junctions through photon-assisted tunneling which is detrimental for applications. We first consider a NIS junction directly coupled to the environment and analyze the subgap leakage current both analytically and numerically; we discuss the link with the phenomenological Dynes parameter. Then, we focus on a circuit where a low-temperature lossy transmission line is inserted between the NIS junction and the environment. We show that the amplitude of the transmitted frequencies relevant for the photon-assisted tunneling is exponentially suppressed as the length ℓ and the resistance per unit length R0 of the line are increased. Consequently, the subgap current is reduced exponentially as well. This property can not be obtained by means of lumped circuit elements. We finally discuss our results in view of the performance of NIS junctions in applications. en
dc.format.extent 174507/1-9
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher American Physical Society (APS) en
dc.relation.ispartofseries Physical Review B en
dc.relation.ispartofseries Volume 88, Issue 17
dc.rights © 2013 American Physical Society (APS). http://www.aps.org/ en
dc.subject.other Physics en
dc.title Leakage current of a superconductor–normal metal tunnel junction connected to a high-temperature environment en
dc.type A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä fi
dc.description.version Peer reviewed en
dc.rights.holder American Physical Society (APS)
dc.contributor.school Perustieteiden korkeakoulu fi
dc.contributor.school School of Science en
dc.contributor.department Department of Applied Physics en
dc.contributor.department Teknillisen fysiikan laitos fi
dc.subject.keyword metal-insulator-superconductors en
dc.subject.keyword tunnel junctions en
dc.subject.keyword refrigiration en
dc.subject.keyword thermometry en
dc.subject.keyword noise en
dc.subject.keyword islands en
dc.identifier.urn URN:NBN:fi:aalto-201505222858
dc.type.dcmitype text en
dc.identifier.doi 10.1103/physrevb.88.174507
dc.type.version Final published version en


Files in this item

This item appears in the following Collection(s)

Show simple item record

Search archive


Advanced Search

article-iconSubmit a publication

Browse

My Account