Long hold times in a two-junction electron trap

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dc.contributor Aalto-yliopisto fi
dc.contributor Aalto University en
dc.contributor.author Kemppinen, A.
dc.contributor.author Lotkhov, S. V.
dc.contributor.author Saira, O.-P.
dc.contributor.author Zorin, A. B.
dc.contributor.author Pekola, Jukka P.
dc.contributor.author Manninen, A. J.
dc.date.accessioned 2015-05-19T09:01:55Z
dc.date.available 2015-05-19T09:01:55Z
dc.date.issued 2011
dc.identifier.citation Kemppinen, A. & Lotkhov, S. V. & Saira, O.-P. & Zorin, A. B. & Pekola, Jukka & Manninen, A. J. 2011. Long hold times in a two-junction electron trap. Applied Physics Letters. Volume 99, Issue 14. P. 142106/1-3. ISSN 0003-6951 (printed). DOI: 10.1063/1.3647557. en
dc.identifier.issn 0003-6951 (printed)
dc.identifier.uri https://aaltodoc.aalto.fi/handle/123456789/16091
dc.description.abstract The hold time τ of a single-electron trap is shown to increase significantly due to suppression of photon assisted tunneling events. Using two rf-tight radiation shields instead of a single one, we demonstrate increase of τ by a factor exceeding 103, up to about 10 h, for a trap with only two superconductor (S)—normal-metal (N) tunnel junctions and an on-chip resistorR ∼ 100 kΩ (R-SNS structure). In the normal state, the improved shielding made it possible to observe τ ∼ 100 s, which is in reasonable agreement with the quantum-leakage-limited level expected for the two-electron cotunneling process. en
dc.format.extent 142106/1-3
dc.format.mimetype application/pdf en
dc.language.iso en en
dc.publisher AIP Publishing en
dc.relation.ispartofseries Applied Physics Letters en
dc.relation.ispartofseries Volume 99, Issue 14
dc.rights © 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters and may be found at http://scitation.aip.org/content/aip/journal/apl/99/14/10.1063/1.3647557 en
dc.subject.other Physics en
dc.title Long hold times in a two-junction electron trap en
dc.type A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä fi
dc.description.version Peer reviewed en
dc.rights.holder American Institute of Physics
dc.contributor.school Perustieteiden korkeakoulu fi
dc.contributor.school School of Science en
dc.contributor.department Department of Applied Physics en
dc.contributor.department Teknillisen fysiikan laitos fi
dc.subject.keyword two-junction en
dc.subject.keyword single-electron trap en
dc.subject.keyword electrometers en
dc.subject.keyword tunneling en
dc.subject.keyword electroluminescence en
dc.subject.keyword photoacoustic imaging en
dc.subject.keyword resistors en
dc.identifier.urn URN:NBN:fi:aalto-201505192742
dc.type.dcmitype text en
dc.identifier.doi 10.1063/1.3647557
dc.type.version Final published version en


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