Citation:
Lingk, C. & Helfer, W. & von Plessen, G. & Feldmann, J. & Stock, K. & Feise, M. W. & Citrin, D. S. & Lipsanen, Harri & Sopanen, M. & Virkkala, R. & Tulkki, J. & Ahopelto, J.. 2000. Carrier capture processes in strain-induced InxGa1-xAs/GaAs quantum dot structures. Physical Review B. Volume 62, Issue 20. P. 13588-13594. ISSN 1098-0121 (printed). DOI: 10.1103/physrevb.62.13588.
|