Conoscopic interferometry of wafers for surface-acoustic wave devices

Äyräs, Pekka; Friberg, Ari T.; Kaivola, Matti; Salomaa, Martti M.

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Conoscopic interferometry of wafers for surface-acoustic wave devices

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Title:	Conoscopic interferometry of wafers for surface-acoustic wave devices
Author(s):	Äyräs, Pekka ; Friberg, Ari T. ; Kaivola, Matti ; Salomaa, Martti M.
Date:	1997
Language:	en
Pages:	4039-4042
Department:	Teknillisen fysiikan laitos Department of Applied Physics
Series:	Journal of Applied Physics, Volume 82, Issue 8
ISSN:	1089-7550 (electronic) 0021-8979 (printed)
DOI-number:	10.1063/1.365755
Subject:	Physics
Keywords:	SAW wafers, LiNbO3 wafer, surface-acoustic wave devices, conoscopic interferometry, orientation, crystals, crystal cuts
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Citation: Äyräs, Pekka & Friberg, Ari T. & Kaivola, Matti & Salomaa, Martti M.. 1997. Conoscopic interferometry of wafers for surface-acoustic wave devices. Journal of Applied Physics. Volume 82, Issue 8. 4039-4042. ISSN 1089-7550 (electronic). ISSN 0021-8979 (printed). DOI: 10.1063/1.365755.
Abstract: We show that in interpreting the conoscopic interference fringes, one should exercise care in employing approximate expressions which fail for certain crystal cuts. In this paper, we study 64°- and 128°-rotated Y-cut and Z-cut LiNbO3 wafers. We show that the error made in using the approximate formulae for the samples is more than 25% and that one has to use exact formulae in order to attain quantitative agreement with the experimental data.
Rights: © 1997 American Intitute of Physics (AIP). This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. http://scitation.aip.org/content/aip/journal/jap
Permanent link to this item: http://urn.fi/URN:NBN:fi:aalto-201504272448 Email this Export to RefWorks QR Code Print BibTex Tweet

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