dc.contributor |
Aalto-yliopisto |
fi |
dc.contributor |
Aalto University |
en |
dc.contributor.author |
Tarzamni, Hadi |
|
dc.contributor.author |
Esmaeelnia, Farhad Panahandeh |
|
dc.contributor.author |
Tahami, Farzad |
|
dc.contributor.author |
Fotuhi-Firuzabad, Mahmud |
|
dc.contributor.author |
Dehghanian, Payman |
|
dc.contributor.author |
Lehtonen, Matti |
|
dc.contributor.author |
Blaabjerg, Frede |
|
dc.date.accessioned |
2021-04-20T06:50:37Z |
|
dc.date.available |
2021-04-20T06:50:37Z |
|
dc.date.issued |
2021-03-22 |
|
dc.identifier.citation |
Tarzamni , H , Esmaeelnia , F P , Tahami , F , Fotuhi-Firuzabad , M , Dehghanian , P , Lehtonen , M & Blaabjerg , F 2021 , ' Reliability Assessment of Conventional Isolated PWM DC-DC Converters ' , IEEE Access , vol. 9 , 9382999 , pp. 46191-46200 . https://doi.org/10.1109/ACCESS.2021.3067935 |
en |
dc.identifier.issn |
2169-3536 |
|
dc.identifier.other |
PURE UUID: ef528571-a9ba-4778-b510-12eb243df715 |
|
dc.identifier.other |
PURE ITEMURL: https://research.aalto.fi/en/publications/ef528571-a9ba-4778-b510-12eb243df715 |
|
dc.identifier.other |
PURE LINK: http://www.scopus.com/inward/record.url?scp=85103269485&partnerID=8YFLogxK |
|
dc.identifier.other |
PURE FILEURL: https://research.aalto.fi/files/62034767/ELEC_Tarzamni_Reliability_Assessment_2021_finalpublishedversion.pdf |
|
dc.identifier.uri |
https://aaltodoc.aalto.fi/handle/123456789/106935 |
|
dc.description |
Publisher Copyright: CCBY Copyright: Copyright 2021 Elsevier B.V., All rights reserved. |
|
dc.description.abstract |
This paper sets forth the reliability analysis of conventional isolated pulse width modulation DC-DC (IDC-DC) converters. The IDC-DC converters are categorized into isolated single-switch DC-DC (ISSDC-DC) or multiple-switch DC-DC (IMSDC-DC) converters. The proposed framework encompasses analyzing the impacts of duty cycle, input voltage, output power, transformer turns ratio, components characteristics and time duration on the overall reliability performance of the IDC-DC converters. The suggested reliability assessment is centered on Markov models characterized by taking into consideration all open and short circuit faults on the components in both continuous and discontinuous conduction modes. We further investigate the self-embedded fault tolerant capability of the IMSDC-DC converters under open circuit fault scenarios on the switches, diodes and blocking capacitors, where we offer new reliability analytics. Along with extensive analyses and comparisons, several experimental results are provided to verify the self-embedded fault tolerant capability of IMSDC-DC converters. |
en |
dc.format.extent |
10 |
|
dc.format.extent |
46191-46200 |
|
dc.format.mimetype |
application/pdf |
|
dc.language.iso |
en |
en |
dc.publisher |
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
|
dc.relation.ispartofseries |
IEEE Access |
en |
dc.relation.ispartofseries |
Volume 9 |
en |
dc.rights |
openAccess |
en |
dc.title |
Reliability Assessment of Conventional Isolated PWM DC-DC Converters |
en |
dc.type |
A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä |
fi |
dc.description.version |
Peer reviewed |
en |
dc.contributor.department |
Sharif University of Technology |
|
dc.contributor.department |
University of Tabriz |
|
dc.contributor.department |
George Washington University |
|
dc.contributor.department |
Department of Electrical Engineering and Automation |
|
dc.contributor.department |
Aalborg University |
|
dc.subject.keyword |
fault analysis |
|
dc.subject.keyword |
Fault tolerance |
|
dc.subject.keyword |
Fault tolerant systems |
|
dc.subject.keyword |
isolated multiple-switch DC-DC converter (IMSDC-DC) |
|
dc.subject.keyword |
Isolated single-switch DC-DC converter (ISSDC-DC) |
|
dc.subject.keyword |
Markov process |
|
dc.subject.keyword |
Markov processes |
|
dc.subject.keyword |
Power electronics |
|
dc.subject.keyword |
Power system reliability |
|
dc.subject.keyword |
Reliability |
|
dc.subject.keyword |
reliability |
|
dc.subject.keyword |
Reliability engineering |
|
dc.identifier.urn |
URN:NBN:fi:aalto-202104206229 |
|
dc.identifier.doi |
10.1109/ACCESS.2021.3067935 |
|
dc.type.version |
publishedVersion |
|