Condition Monitoring of an X-ray Analyzer



Title:	Condition Monitoring of an X-ray Analyzer
Author(s):	Mattila, Marko
Date:	2002
Language:	en
Pages:	71
Department:	Automaatio- ja systeemitekniikan osasto
Major/Subject:	Automaation tietotekniikka
Supervising professor(s):	Koskinen, Kari
Keywords:	fault detection and isolation, FDI, condition monitoring, data-based methods, PCS, PLS, CBR, subspace identification
	OEVS yes
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Permanent link to this item: http://urn.fi/URN:NBN:fi:aalto-202104145531 Email this Export to RefWorks QR Code Print BibTex Tweet