Learning Centre

Browsing by Keyword "diffraktometria"

 |  Login

Browsing by Keyword "diffraktometria"

Sort by: Order: Results:

  • Thumbnail
    Pdf icon
    Title: Linear and traceable scales for nanometrology  Author(s): Seppä, Jeremias Date: 2014 Series: Aalto University publication series DOCTORAL DISSERTATIONS, 176/2014 School of Electrical Engineering | Doctoral thesis (article-based) |  Defence date: 2014-12-05

Search archive

article-iconSubmit a publication

Browse