Title:Evaluation of the concentration of point defects in GaN
Author(s):Reshchikov, M. A.; Usikov, A.; Helava, H.; Makarov, Yu N.; Prozheeva, V.; Makkonen, I.; Tuomisto, F.; Leach, J. H.; Udwary, K.Date:2017-12-01Series:Scientific Reports, Volume 7, issue 1
Title:Hole density and acceptor-type defects in MBE-grown GaSb1-x Bix
Author(s):Segercrantz, N.; Slotte, J.; Makkonen, I.; Tuomisto, F.; Sandall, I. C.; Ashwin, M.J.; Veal, T.D.Date:2017-07-03Series:Journal of Physics D: Applied Physics, Volume 50, issue 29
Title:Identification of substitutional Li in n-type ZnO and its role as an acceptor
Author(s):Johansen, K. M.; Zubiaga, A.; Makkonen, I.; Tuomisto, Filip; Neuvonen, P. T.; Knutsen, K. E.; Monakhov, E. V.; Kuznetsov, A. Yu.; Svensson, B. G.Date:2011Series:Physical Review B, Volume 83, Issue 24School of Science
Title:Modeling positronium beyond the single particle approximation
Author(s):Zubiaga, A.; Ervasti, M. M.; Makkonen, I.; Harju, A.; Tuomisto, F.; Puska, M. J.Date:2016-02-29Series:JOURNAL OF PHYSICS B: ATOMIC MOLECULAR AND OPTICAL PHYSICS, Volume 49, issue 6