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Browsing by Author "Asenov, Asen"

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Title: Impact of the Effective Mass on the Mobility in Si Nanowire Transistors Author(s): Medina-Bailon, Cristina; Sadi, Toufik; Nedjalkov, Mihail; Lee, Jaehyun; Berrada, Salim; Carrillo-Nunez, Hamilton; Georgiev, Vihar P.; Selberherr, Siegfried; Asenov, Asen Date: 2018-11-28 Series: SISPAD 2018 - 2018 International Conference on Simulation of Semiconductor Processes and Devices, Proceedings, Volume 2018-September
Title: Impact of the trap attributes on the gate leakage mechanisms in a 2D MS-EMC nanodevice simulator Author(s): Medina-Bailon, Cristina; Sadi, Toufik; Sampedro, Carlos; Padilla, Jose Luis; Donetti, Luca; Georgiev, Vihar; Gamiz, Francisco; Asenov, Asen Date: 2019-01-01 Series: Numerical Methods and Applications - 9th International Conference, NMA 2018, Revised Selected Papers, Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), Volume 11189 LNCS
Title: Multiscale modeling of charge trapping in molecule based flash memories Author(s): Badami, Oves; Sadi, Toufik; Georgiev, Vihar; Adamu-Lema, Fikru; Thirunavukkarasu, Vasanthan; Ding, Jie; Asenov, Asen Date: 2019-09-01 Series: Proceedings of 2019 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2019
Title: Multisubband ensemble Monte Carlo analysis of tunneling leakage mechanisms in ultrascaled FDSOI, DGSOI, and FinFET devices Author(s): Medina-Bailon, Cristina; Padilla, José L.; Sadi, Toufik; Sampedro, Carlos; Godoy, Andrés; Donetti, Luca; Georgiev, Vihar P.; Gámiz, Francisco; Asenov, Asen Date: 2019-03-01 Series: IEEE Transactions on Electron Devices, Volume 66, issue 3
Title: Physical Insights into the Transport Properties of RRAMs Based on Transition Metal Oxides Author(s): Sadi, Toufik; Badami, Oves; Georgiev, Vihar; Ding, Jie; Asenov, Asen Date: 2019-09-01 Series: Proceedings of 2019 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2019
Title: Simulation of the impact of ionized impurity scattering on the total mobility in si nanowire transistors Author(s): Sadi, Toufik; Medina-Bailon, Cristina; Nedjalkov, Mihail; Lee, Jaehyun; Badami, Oves; Berrada, Salim; Carrillo-Nunez, Hamilton; Georgiev, Vihar; Selberherr, Siegfried; Asenov, Asen Date: 2019-01-02 Series: Materials, Volume 12, issue 1
Title: Understanding Electromigration in Cu-CNT Composite Interconnects Author(s): Lee, Jaehyun; Berrada, Salim; Adamu-Lema, Fikru; Nagy, Nicole; Georgiev, Vihar P.; Sadi, Toufik; Liang, Jie; Ramos, Raphael; Carrillo-Nunez, Hamilton; Kalita, Dipankar; Lilienthal, Katharina; Wislicenus, Marcus; Pandey, Reeturaj; Chen, Bingan; Teo, Kenneth B.K.; Goncalves, Goncalo; Okuno, Hanako; Uhlig, Benjamin; Todri-Sanial, Aida; Dijon, Jean; Asenov, Asen Date: 2018 Series: IEEE Transactions on Electron Devices, Volume 65, issue 9